By Kenneth M. Butler
For a long time, the dominant fault version in computerized try development gen eration (ATPG) for electronic built-in circuits has been the stuck-at fault version. The static nature of stuck-at fault trying out compared to the super dynamic nature of built-in circuit (IC) expertise has prompted many to query even if stuck-at fault dependent checking out remains to be potential. makes an attempt at answering this query haven't been utterly pleasant as a result of a scarcity of real quantification, statistical importance, and/or excessive computational price. during this monograph we introduce a technique to deal with the ques tion in a way which circumvents the drawbacks of past ways. the strategy relies on symbolic Boolean sensible analyses utilizing Or dered Binary determination Diagrams (OBDDs). OBDDs were conjectured to be an enticing illustration shape for Boolean services, even though situations ex ist for which their complexity is sure to develop exponentially with enter cardinality. sessions of Boolean features which make the most the efficiencies inherent in OBDDs to a really nice quantity are tested in bankruptcy 7. designated equa tions giving their OBDD sizes are derived, while till very lately in basic terms dimension bounds were on hand. those dimension equations recommend that directly ahead functions of OBDDs to layout and try out similar difficulties won't end up as fruitful as was thought.
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Additional resources for Assessing Fault Model and Test Quality
Such problems are often circumvented by setting a backtrack limit. When the backtrack limit is exceeded, the fault is aborted and no test is specified for it. The problem of redundant faults has traditionally been a cause of great concern, although recent conventional ATPG systems have reported good results in locating redundant faults with low backtrack limits [SCHU88b], [SCHU88a], [GIRA90). 3 Boolean Functional Test Generation As we saw in the last section, proving a fault redundant requires the exhaustive search of large spaces.
Because the result of ! is independent of the value of the variables in such residues, these j - 1 vertices should be removed , as well as the j - 2 interior vertices at index n - 1 which only have paths to the v (v) termini, ... , until a single vertex is removed. 4) i=O vertices. We will perform this operation for several classes of symmetric functions below. ••••••••• ••• variable (index) 1 •••••••••. '. 2: An illustration of the assignment of v (or v) to j contiguous termini. 5. DERIVATION OF OBDD SIZE EQUATIONS prove the following statement.
1 The cone of influence of a line in a circuit consists of all the gates and primary inputs which feed the line either directly or indirectly. 2 Functional decomposition, as used here, means that some function f( Xi, ... , Xj) is represented by a single switching variable in symbolic calculations. The complementary operation to decomposition is composition, where the single variable is replaced by the function that it represents. 3 A function f(xI,"" xn) is independent of variable Xi if: f(XI, ...