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Download Assessing Fault Model and Test Quality by Kenneth M. Butler PDF

By Kenneth M. Butler

For a long time, the dominant fault version in computerized try development gen­ eration (ATPG) for electronic built-in circuits has been the stuck-at fault version. The static nature of stuck-at fault trying out compared to the super dynamic nature of built-in circuit (IC) expertise has prompted many to query even if stuck-at fault dependent checking out remains to be potential. makes an attempt at answering this query haven't been utterly pleasant as a result of a scarcity of real quantification, statistical importance, and/or excessive computational price. during this monograph we introduce a technique to deal with the ques­ tion in a way which circumvents the drawbacks of past ways. the strategy relies on symbolic Boolean sensible analyses utilizing Or­ dered Binary determination Diagrams (OBDDs). OBDDs were conjectured to be an enticing illustration shape for Boolean services, even though situations ex­ ist for which their complexity is sure to develop exponentially with enter cardinality. sessions of Boolean features which make the most the efficiencies inherent in OBDDs to a really nice quantity are tested in bankruptcy 7. designated equa­ tions giving their OBDD sizes are derived, while till very lately in basic terms dimension bounds were on hand. those dimension equations recommend that directly­ ahead functions of OBDDs to layout and try out similar difficulties won't end up as fruitful as was thought.

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Such problems are often circumvented by setting a backtrack limit. When the backtrack limit is exceeded, the fault is aborted and no test is specified for it. The problem of redundant faults has traditionally been a cause of great concern, although recent conventional ATPG systems have reported good results in locating redundant faults with low backtrack limits [SCHU88b], [SCHU88a], [GIRA90). 3 Boolean Functional Test Generation As we saw in the last section, proving a fault redundant requires the exhaustive search of large spaces.

Because the result of ! is independent of the value of the variables in such residues, these j - 1 vertices should be removed , as well as the j - 2 interior vertices at index n - 1 which only have paths to the v (v) termini, ... , until a single vertex is removed. 4) i=O vertices. We will perform this operation for several classes of symmetric functions below. ••••••••• ••• variable (index) 1 •••••••••. '. 2: An illustration of the assignment of v (or v) to j contiguous termini. 5. DERIVATION OF OBDD SIZE EQUATIONS prove the following statement.

1 The cone of influence of a line in a circuit consists of all the gates and primary inputs which feed the line either directly or indirectly. 2 Functional decomposition, as used here, means that some function f( Xi, ... , Xj) is represented by a single switching variable in symbolic calculations. The complementary operation to decomposition is composition, where the single variable is replaced by the function that it represents. 3 A function f(xI,"" xn) is independent of variable Xi if: f(XI, ...

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